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POSITIVE SECONDARY-ION EMISSION FROM FE-NI ALLOYS UNDER O-2+ BOMBARDMENT AT 45-DEGREES INCIDENCE

被引：5
作者：
REUTER, W
YU, ML
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 05期
关键词：
D O I：
10.1063/1.331119
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：3784 / 3786
页数：3
相关论文
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[2]   AN AES-SIMS STUDY OF SILICON OXIDATION INDUCED BY ION OR ELECTRON-BOMBARDMENT [J].
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[3]  
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[4]   SECONDARY ION EMISSION FROM BINARY ALLOY SYSTEMS .1. O-2(+) BOMBARDMENT [J].
YU, ML ;
REUTER, W .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (03) :1478-1488
[5]   MATRIX EFFECT IN SIMS ANALYSIS USING AN O2+ PRIMARY BEAM [J].
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REUTER, W .
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