COMPOSITIONAL PROFILE OF HGCDTE IN METALORGANIC CHEMICAL VAPOR-DEPOSITION (MOCVD) SYSTEM WITH MULTINOZZLES

被引:8
作者
MURAKAMI, S
SAKACHI, Y
NISHINO, H
SAITO, T
SHINOHARA, K
TAKIGAWA, H
机构
[1] Fujitsu Laboratories Ltd., Atsugi, 243-01
关键词
D O I
10.1016/0022-0248(92)90712-R
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We studied the dependence of the compositional profile on the nozzle configuration in Hg1-xCdxTe growth using a metalorganic chemical vapor deposition (MOCVD) system having multinozzle injectors and a rotating susceptor in a vertical reactor. In growth, the composition depends on the concentration of dimethyl-cadmium (DMCd). In the epilayer grown by injecting DMCd from one nozzle, the x-value was highest just beneath the nozzle. The x-value peak shifts towards the rotation center when the epilayer is grown from an off-center nozzle with rotation. The compositional profile of the epilayer grown by the injection of DMCd from two nozzles was the same as the summation of the two profiles produced with one, and then the other nozzle. In a simulation based on these results, we found that 8 nozzle injectors are needed to grow the epilayer on a 3-inch substrate within a compositional variation (DELTA-x) of 0.002.
引用
收藏
页码:33 / 36
页数:4
相关论文
共 13 条
[1]   MATERIAL CHARACTERISTICS OF METALORGANIC CHEMICAL VAPOR-DEPOSITION HG1-XCDXTE/GAAS/SI [J].
EDWALL, DD ;
BAJAJ, J ;
GERTNER, ER .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (02) :1045-1048
[2]   INDIUM DOPING OF N-TYPE HGCDTE LAYERS GROWN BY ORGANOMETALLIC VAPOR-PHASE EPITAXY [J].
GHANDHI, SK ;
TASKAR, NR ;
PARAT, KK ;
BHAT, IB .
APPLIED PHYSICS LETTERS, 1990, 57 (03) :252-254
[3]  
GHANDHI SK, 1990, MATER RES SOC SYMP P, V161, P331
[4]   A STUDY OF TRANSPORT AND PYROLYSIS IN THE GROWTH OF CDXHG1-XTE BY MOVPE [J].
IRVINE, SJC ;
TUNNICLIFFE, J ;
MULLIN, JB .
JOURNAL OF CRYSTAL GROWTH, 1983, 65 (1-3) :479-484
[5]   A STUDY OF THE STRUCTURE AND ELECTRICAL-PROPERTIES OF CDXHG1-XTE GROWN BY METALORGANIC VAPOR-PHASE EPITAXY (INTERDIFFUSED MULTILAYER PROCESS) [J].
IRVINE, SJC ;
GOUGH, JS ;
GIESS, J ;
GIBBS, MJ ;
ROYLE, A ;
TAYLOR, CA ;
BROWN, GT ;
KEIR, AM ;
MULLIN, JB .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (02) :285-290
[6]   THE INFLUENCE OF CRYSTALLOGRAPHIC ORIENTATION ON GALLIUM INCORPORATION IN HGCDTE GROWN BY METALORGANIC CHEMICAL VAPOR-DEPOSITION ON GAAS [J].
KORENSTEIN, R ;
HALLOCK, P ;
MACLEOD, B ;
HOKE, W ;
OGUZ, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (02) :1039-1044
[7]   THE METALORGANIC CHEMICAL VAPOR-DEPOSITION GROWTH OF HGCDTE ON GAAS AT 300-DEGREES-C USING DIISOPROPYLTELLURIDE [J].
KORENSTEIN, R ;
HALLOCK, P ;
MACLEOD, B .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (03) :1630-1633
[8]  
KURAMATA A, 1989, I PHYS C SER, V96, P113
[9]   THE ORGANOMETALLIC EPITAXY OF EXTRINSIC P-DOPED HGCDTE [J].
TASKAR, NR ;
BHAT, IB ;
PARAT, KK ;
TERRY, D ;
EHSANI, H ;
GHANDHI, SK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (02) :281-284
[10]  
TASKAR NR, 1991, MATER RES SOC SYMP P, V216, P29