SURFACE-DIFFUSION LENGTH UNDER KINETIC GROWTH-CONDITIONS

被引:36
作者
GHAISAS, SV
DASSARMA, S
机构
[1] Joint Program for Advanced Electronic Materials, Department of Physics, University of Maryland, College Park
来源
PHYSICAL REVIEW B | 1992年 / 46卷 / 11期
关键词
D O I
10.1103/PhysRevB.46.7308
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We obtain, using both a direct numerical simulation and a kinetic scaling argument, the atomistic surface diffusion length under kinetic growth conditions such as molecular beam epitaxy. The diffusion length shows strong crossover effects arising from two different physical mechanisms: The number of adatoms (two or three) in the stable islands which define incorporation, and the ratio of the atomistic deposition rate (high or low) to the atomistic hopping rate at the growth front. We give detailed results for the functional dependence of the diffusion length on the growth rate.
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页码:7308 / 7311
页数:4
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