SILICON SELF-DIFFUSION IN THIN SIO2 AND PTSI FILMS

被引:23
作者
PRETORIUS, R [1 ]
BOTHA, AP [1 ]
LOMBAARD, JC [1 ]
机构
[1] UNIV STELLENBOSCH,DEPT PHYS,DIV SOLID STATE,STELLENBOSCH 7600,SOUTH AFRICA
关键词
D O I
10.1016/0040-6090(81)90428-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:61 / 68
页数:8
相关论文
共 22 条
[1]   The Formation and Devitrification of Oxides on Silicon [J].
Ainger, F. W. .
JOURNAL OF MATERIALS SCIENCE, 1966, 1 (01) :1-13
[2]   PT2SI AND PTSI FORMATION WITH HIGH-PURITY PT THIN-FILMS [J].
CANALI, C ;
CATELLANI, C ;
PRUDENZIATI, M ;
WADLIN, WH ;
EVANS, CA .
APPLIED PHYSICS LETTERS, 1977, 31 (01) :43-45
[3]  
Chu WK., 1978, BACKSCATTERING SPECT
[4]   GROWTH-RATES FOR PT2SI AND PTSI FORMATION UNDER UHV AND CONTROLLED IMPURITY ATMOSPHERES [J].
CRIDER, CA ;
POATE, JM .
APPLIED PHYSICS LETTERS, 1980, 36 (06) :417-419
[5]   GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON [J].
DEAL, BE ;
GROVE, AS .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3770-&
[7]   THERMAL OXIDATION OF HEAVILY DOPED SILICON [J].
DEAL, BE ;
SKLAR, M .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (04) :430-+
[8]  
GHOZLENE HB, 1978, J APPL PHYS, V49, P3998, DOI 10.1063/1.325358
[9]  
Goldschmidt H. J., 1967, INTERSTITIAL ALLOYS, DOI [10.1007/978-1-4899-5880-8, DOI 10.1007/978-1-4899-5880-8]
[10]   LOW-TEMPERATURE MIGRATION OF SILICON IN THIN LAYERS OF GOLD AND PLATINUM [J].
HIRAKI, A ;
NICOLET, MA ;
MAYER, JW .
APPLIED PHYSICS LETTERS, 1971, 18 (05) :178-&