SILICON SELF-DIFFUSION IN THIN SIO2 AND PTSI FILMS

被引:23
作者
PRETORIUS, R [1 ]
BOTHA, AP [1 ]
LOMBAARD, JC [1 ]
机构
[1] UNIV STELLENBOSCH,DEPT PHYS,DIV SOLID STATE,STELLENBOSCH 7600,SOUTH AFRICA
关键词
D O I
10.1016/0040-6090(81)90428-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:61 / 68
页数:8
相关论文
共 22 条
[11]   Silicon Oxidation Studies: The Role of H2O [J].
Irene, E. A. ;
Ghez, R. .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (11) :1757-1761
[12]   SILICON OXIDATION STUDIES - ANALYSIS OF SIO2 FILM GROWTH DATA [J].
IRENE, EA ;
VANDERMEULEN, YJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (09) :1380-1384
[13]   THE MECHANISMS FOR SILICON OXIDATION IN STEAM AND OXYGEN [J].
LIGENZA, JR ;
SPITZER, WG .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1960, 14 :131-136
[14]   SOLID-SOLID REACTIONS IN PT-SI SYSTEMS [J].
MUTA, H ;
SHINODA, D .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (06) :2913-+
[15]   KINETICS AND MECHANISM OF PLATINUM SILICIDE FORMATION ON SILICON [J].
POATE, JM ;
TISONE, TC .
APPLIED PHYSICS LETTERS, 1974, 24 (08) :391-393
[16]   SI-31 TRACER STUDIES OF THE OXIDATION OF SI, COSI2, AND PTSI [J].
PRETORIUS, R ;
STRYDOM, W ;
MAYER, JW .
PHYSICAL REVIEW B, 1980, 22 (04) :1885-1891
[18]   MARKER STUDIES OF SILICIDE FORMATION, SILICON SELF-DIFFUSION AND SILICON EPITAXY USING RADIOACTIVE SILICON AND RUTHERFORD BACKSCATTERING [J].
PRETORIUS, R ;
RAMILLER, CL ;
NICOLET, MA .
NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :629-633
[19]   O-18 STUDY OF THE THERMAL-OXIDATION OF SILICON IN OXYGEN [J].
ROSENCHER, E ;
STRABONI, A ;
RIGO, S ;
AMSEL, G .
APPLIED PHYSICS LETTERS, 1979, 34 (04) :254-256
[20]   THERMAL-STABILITY OF THIN PTSI FILMS ON SILICON SUBSTRATES [J].
SINHA, AK ;
SHENG, TT ;
MARCUS, RB ;
HASZKO, SE .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (09) :3637-+