PREPARATION AND CHARACTERIZATION OF THIN-FILMS OF MGO, AL2O3 AND MGAL2O4 BY ATOMIC LAYER DEPOSITION

被引:36
作者
HUANG, R [1 ]
KITAI, AH [1 ]
机构
[1] MCMASTER UNIV,DEPT ENGN PHYS & MAT SCI & ENGN,HAMILTON L8S 4M1,ONTARIO,CANADA
关键词
ATOMIC LAYER DEPOSITION; MGO; AL2O3; MGAL2O4; THIN FILMS;
D O I
10.1007/BF02665029
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
MgO, Al2O3 and MgAl2O4 thin films were deposited on silicon substrates at various temperatures by the atomic layer deposition (ALD) method using bis(cyclopentadienyl)magnesium, triethylaluminum, and H2O and were characterized systematically. High-quality polycrystalline MgO films were deposited for a substrate temperature above 500-degrees-C, and amorphous thin films were deposited around 400-degrees-C. The deposited Al2O3 and MgAl2O4 thin films were characterized as amorphous in structure. Applicability of ALD to complex oxides is discussed.
引用
收藏
页码:215 / 220
页数:6
相关论文
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