DOUBLE CRYSTAL X-RAY-DIFFRACTION CHARACTERIZATION OF MULTILAYER HETEROEPITAXIAL STRUCTURES WITH SUB-MICRON LAYERS

被引：5

作者：

FALEEV, NN

FLAKS, LI

KONNIKOV, SG

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1989年 / 113卷 / 02期

关键词：

D O I：

10.1002/pssa.2211130221

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：431 / 437

页数：7

共 12 条

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