OPTICAL TRANSIENT SPECTROSCOPY OF DEEP LEVELS IN SEMICONDUCTORS USING FOURIER TECHNIQUE

被引：1

作者：

LARSSON, K

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1987年 / 20卷 / 12期

关键词：

D O I：

10.1088/0022-3735/20/12/011

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1480 / 1483

页数：4

共 9 条

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