DEGRADATION OF ACTIVE REGION IN INGAASP/INP BURIED HETEROSTRUCTURE LASERS

被引：33

作者：

FUKUDA, M

IWANE, G

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1985年 / 58卷 / 08期

关键词：

D O I：

10.1063/1.336298

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2932 / 2936

页数：5

共 10 条

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[2]

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[7] RELIABILITY OF INGAASP/INP BURIED HETEROSTRUCTURE 1.3-MU-M LASERS [J].

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