ANOMALOUS FORCE DEPENDENCE OF AFM CORRUGATION HEIGHT OF A GRAPHITE SURFACE IN AIR

被引：3

作者：

ISHIZAKA, T

SUGAWARA, Y

KUMAGAI, K

MORITA, S

机构：

[1] IWATE UNIV, FAC ENGN, DEPT ELECTR ENGN, MORIOKA, IWATE 020, JAPAN

[2] HIROSHIMA UNIV, FAC SCI, DEPT PHYS, HIROSHIMA 730, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1990年 / 29卷 / 07期

关键词：

Afm (atomic force microscope); Afm/pcm; Corrugation height; Force dependence; Graphite surface; Repulsive force;

D O I：

10.1143/JJAP.29.L1196

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

To investigate the force dependence of the AFM corrugation height of graphite under strong repulsive force, we measured the AFM corrugation height and tunneling current between the W lever and graphite surface simultaneously as a function of repulsive force up to ∼1.5×10-5 N. As a result, we found a peak of the AFM corrugation height at ∼1.1×10-5 N where the tunneling current showed a sudden increase. Even after the sudden increase of the tunneling current, we could observe atomically resolved AFM/PCM (point contact microscope) images simultaneously. © 1990 The Japan Society of Applied Physics.

引用

页码：L1196 / L1198

页数：3

共 15 条

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602

[2] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274

[3] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[4] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

FUCHS, H ;

GERBER, C ;

ROHRER, H ;

STOLL, E ;

TOSATTI, E .

EUROPHYSICS LETTERS, 1986, 1 (01) :31-36

[5] SURFACE IMAGING IN AIR WITH A FORCE MICROSCOPE [J].

ISHIZAKA, T ;

MORITA, S ;

SUGAWARA, Y ;

OKADA, T ;

MISHIMA, S ;

IMAI, S ;

MIKOSHIBA, N .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :391-393

[6] CONTAMINATION-MEDIATED DEFORMATION OF GRAPHITE BY THE SCANNING TUNNELING MICROSCOPE [J].

MAMIN, HJ ;

GANZ, E ;

ABRAHAM, DW ;

THOMSON, RE ;

CLARKE, J .

PHYSICAL REVIEW B, 1986, 34 (12) :9015-9018

[7] ATOMIC RESOLUTION ATOMIC FORCE MICROSCOPY OF GRAPHITE AND THE NATIVE OXIDE ON SILICON [J].

MARTI, O ;

DRAKE, B ;

GOULD, S ;

HANSMA, PK .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :287-290

[8] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES [J].

MARTI, O ;

DRAKE, B ;

HANSMA, PK .

APPLIED PHYSICS LETTERS, 1987, 51 (07) :484-486

[9] SCANNING TUNNELING MICROSCOPY OF KISH GRAPHITE AND HIGHLY ORIENTED PYROLYTIC-GRAPHITE IN AIR [J].

MORITA, S ;

TSUKADA, S ;

MIKOSHIBA, N .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :354-357

[10] TUNNELING MICROSCOPY OF GRAPHITE IN AIR [J].

PARK, SI ;

QUATE, CF .

APPLIED PHYSICS LETTERS, 1986, 48 (02) :112-114

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