AN ATOMIC-RESOLUTION CRYOGENIC SCANNING TUNNELING MICROSCOPE

被引:9
作者
CHEN, X
FRANK, ER
HAMERS, RJ
机构
[1] Department of Chemistry, University of Wisconsin, Madison
关键词
D O I
10.1063/1.1144575
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A design is presented for a cryogenic scanning tunneling microscope which has demonstrated atomic resolution at temperatures between 300 and 120 K in ultrahigh vacuum. The design features simple in situ exchange of samples and tips, active cooling of the sample, excellent visibility of the sample-tip region, and the use of a thermally isolated inchworm translator for coarse approach. It has demonstrated atomic resolution on SI(111)-(7×7) and Si(001) surfaces at 120 K.
引用
收藏
页码:3373 / 3377
页数:5
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