SURFACE STEPS IMAGED BY SECONDARY ELECTRONS

被引：20

作者：

MILNE, RH ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

ULTRAMICROSCOPY | 1989年 / 27卷 / 04期

关键词：

D O I：

10.1016/0304-3991(89)90012-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：433 / 437

页数：5

相关论文

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