LOW-TEMPERATURE 3C-SIC HETEROEPITAXIAL FILM GROWTH ON SI BY REACTIVE-ION-BEAM DEPOSITION

被引:17
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YAMADA, H
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10.1063/1.342854
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O59 [应用物理学];
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页码:2084 / 2089
页数:6
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[1]   BUFFER-LAYER TECHNIQUE FOR THE GROWTH OF SINGLE-CRYSTAL SIC ON SI [J].
ADDAMIANO, A ;
SPRAGUE, JA .
APPLIED PHYSICS LETTERS, 1984, 44 (05) :525-527
[2]  
Air Force Cambridge Research Laboratories (U.S.)
[3]  
University of South Carolina in: Silicon Carbide, 1974, SILICON CARBIDE 1973
[4]   ELECTRON MOBILITY MEASUREMENTS IN SIC POLYTYPES [J].
BARRETT, DL ;
CAMPBELL, RB .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (01) :53-+
[5]   ACCEPTOR DOPANTS IN SILICON MOLECULAR-BEAM EPITAXY [J].
BECKER, GE ;
BEAN, JC .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (08) :3395-3399
[6]  
Brown S.C., 1967, BASIC DATA PLASMA PH
[7]  
Carter G., 1968, ION BOMBARDMENT SOLI
[8]   HIGH-FIELD TRANSPORT IN WIDE-BAND-GAP SEMICONDUCTORS [J].
FERRY, DK .
PHYSICAL REVIEW B, 1975, 12 (06) :2361-2369
[10]   REMOVAL OF OXIDE-FILMS FROM SILICON SURFACES IN A HIGH-VACUUM SYSTEM - INSITU ELLIPSOMETRIC STUDY [J].
HOPPER, MA ;
CLARKE, RA ;
YOUNG, L .
SURFACE SCIENCE, 1976, 56 (01) :472-481