学术探索
学术期刊
新闻热点
数据分析
智能评审

TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS USING SYNCHROTRON-RADIATION

被引：28
作者：
STRELI, C
WOBRAUSCHEK, P
LADISICH, W
RIEDER, R
AIGINGER, H
RYON, RW
PIANETTA, P
机构：
[1] STANFORD SYNCHROTRON RADIAT LAB, STANFORD, CA USA
[2] LAWRENCE LIVERMORE NATL LAB, LIVERMORE, CA 94550 USA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 345卷 / 02期
关键词：
D O I：
10.1016/0168-9002(94)91019-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Synchrotron radiation from SSRL (Stanford Synchrotron Radiation Laboratory) Beam Line III-4 was used as excitation source for Total Reflection X-ray Fluorescence Analysis (TXRF) of light elements (Z < 14). Due to the outstanding features of synchrotron radiation this source is best suited for the photon induced excitation of light elements offering a large number of photons in the energy range of interest. The high intensity and the natural collimation of the beam is ideal for total reflection geometry. The experiments were performed with a special TXRF spectrometer using an ultrathin window Ge(HP) detector for the energy dispersive measurement of light elements. BL III-4 is equipped with a cut-off mirror (E(cut) = 3 keV) for white beam measurements, and a double multilayer monochromator can be inserted. Detection limits of some hundred femtograms have been obtained for Mg with the white beam excitation. Boron could be detected with monochromatic excitation.
引用
收藏
页码：399 / 403
页数：5
相关论文
共 26 条
[1]   METHOD FOR QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS IN NANOGRAM REGION [J].
AIGINGER, H ;
WOBRAUSC.P .
NUCLEAR INSTRUMENTS & METHODS, 1974, 114 (01) :157-158
[2]  
GILFRICH JV, 1989, ADV XRAY ANAL, V32, P1
[3]   ULTRATRACE ANALYSIS BY SYNCHROTRON RADIATION [J].
GOHSHI, Y .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 303 (03) :544-551
[4]   X-RAY-MICROANALYSIS WITH ENERGY TUNABLE SYNCHROTRON X-RAYS [J].
HAYAKAWA, S ;
GOHSHI, Y ;
IIDA, A ;
AOKI, S ;
ISHIKAWA, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 49 (1-4) :555-560
[5]   RECENT RESULTS USING SYNCHROTRON RADIATION FOR ENERGY-DISPERSIVE X-RAY-FLUORESCENCE ANALYSIS [J].
JAKLEVIC, JM ;
GIAUQUE, RD ;
THOMPSON, AC .
X-RAY SPECTROMETRY, 1990, 19 (02) :53-58
[6]   QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS USING MONOCHROMATIC SYNCHROTRON RADIATION [J].
JAKLEVIC, JM ;
GIAUQUE, RD ;
THOMPSON, AC .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 10-1 (MAY) :303-308
[7]  
Klockenkaemper R., 1990, SPECTROSCOPY, V5, P26
[8]   TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS WITH MONOENERGETIC EXCITATION AND FULL SPECTRUM EXCITATION USING ROTATING ANODE X-RAY TUBES [J].
LADISICH, W ;
RIEDER, R ;
WOBRAUSCHEK, P ;
AIGINGER, H .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1993, 330 (03) :501-506
[9]  
MADDEN M, 1993, P MATER RES SOC, V307, P125
[10]   SYNCHROTRON-BASED X-RAY-LITHOGRAPHY AT STANFORD-UNIVERSITY [J].
PAN, L ;
KING, PL ;
PIANETTA, P ;
SELIGSON, D ;
BARBEE, TW .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1988, 266 (1-3) :287-292
123