EXPERIMENTAL CONDITIONS FOR UNIFORM ANISOTROPIC ETCHING OF SILICON WITH A MICROWAVE ELECTRON-CYCLOTRON RESONANCE PLASMA SYSTEM

被引:31
作者
HOPWOOD, J
REINHARD, DK
ASMUSSEN, J
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 06期
关键词
D O I
10.1116/1.584197
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:1896 / 1899
页数:4
相关论文
共 9 条
  • [1] THE EXPERIMENTAL TEST OF A MICROWAVE ION-BEAM SOURCE IN OXYGEN
    ASMUSSEN, J
    DAHIMENE, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (01): : 328 - 331
  • [2] CHERRINGTON BE, 1979, GASEOUS ELECTRONICS
  • [3] Franklin R N, 1976, PLASMA PHENOMENA GAS
  • [4] PLASMA-ETCHING WITH A MICROWAVE CAVITY PLASMA DISK SOURCE
    HOPWOOD, J
    DAHIMENE, M
    REINHARD, DK
    ASMUSSEN, J
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (01): : 268 - 271
  • [5] THE ETCHING OF SILICON IN DILUTED SF6 PLASMAS - CORRELATION BETWEEN THE FLUX OF INCIDENT SPECIES AND THE ETCHING KINETICS
    MAHI, B
    ARNAL, Y
    POMOT, C
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (03): : 657 - 666
  • [6] METHODS OF CREATION AND EFFECT OF MICROWAVE PLASMAS UPON THE ETCHING OF POLYMERS AND SILICON.
    Paraszczak, J.
    Heidenreich, J.
    Hatzakis, M.
    Moisan, M.
    [J]. Microelectronic Engineering, 1985, 3 (1-4) : 397 - 410
  • [7] ANISOTROPIC ETCHING OF SILICON USING AN SF6/AR MICROWAVE MULTIPOLAR PLASMA
    POMOT, C
    MAHI, B
    PETIT, B
    ARNAL, Y
    PELLETIER, J
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01): : 1 - 5
  • [8] POMOT C, 1988, J VAC SCI TECHNOL B, V6, P268
  • [9] MICROWAVE PLASMA ETCHING
    SUZUKI, K
    OKUDAIRA, S
    SAKUDO, N
    KANOMATA, I
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (11) : 1979 - 1984