MODELING AND SIMULATIONS OF A POSITIVE CHEMICALLY AMPLIFIED PHOTORESIST FOR X-RAY-LITHOGRAPHY

被引:34
作者
KRASNOPEROVA, AA
KHAN, M
RHYNER, S
TAYLOR, JW
ZHU, Y
CERRINA, F
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 06期
关键词
D O I
10.1116/1.587571
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:3900 / 3904
页数:5
相关论文
共 21 条
[1]   PERFORMANCE OPTIMIZATION OF THE CHEMICALLY AMPLIFIED RADIATION RESIST RAY-PF [J].
BALLHORN, RU ;
DAMMEL, R ;
DAVID, HH ;
ECKES, C ;
FRICKEDAMM, A ;
KREUER, K ;
PAWLOWSKI, G ;
PRZYBILLA, K .
MICROELECTRONIC ENGINEERING, 1991, 13 (1-4) :73-78
[2]   TRANSMIT - A BEAMLINE MODELING PROGRAM [J].
CERRINA, F ;
BASZLER, F ;
TURNER, S ;
KHAN, M .
MICROELECTRONIC ENGINEERING, 1993, 21 (1-4) :103-106
[3]   PHOTOCATALYTIC NOVOLAK-BASED POSITIVE RESIST FOR X-RAY LITHOGRAPHY - KINETICS AND SIMULATION. [J].
Dammel, R. ;
Doessel, K.F. ;
Lingnau, J. ;
Theis, J. ;
Huber, H.L. ;
Oertel, H. .
Microelectronic Engineering, 1987, 6 (1-4) :503-509
[4]   CHARACTERIZATION OF POSITIVE PHOTORESIST [J].
DILL, FH ;
HORNBERGER, WP ;
HAUGE, PS ;
SHAW, JM .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, ED22 (07) :445-452
[5]  
EIB NK, 1993, P SOC PHOTO-OPT INS, V1925, P186, DOI 10.1117/12.154751
[6]   MODELING AND SIMULATION OF A DEEP-ULTRAVIOLET ACID HARDENING RESIST [J].
FERGUSON, RA ;
HUTCHINSON, JM ;
SPENCE, CA ;
NEUREUTHER, AR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06) :1423-1427
[7]  
FEYNYSHYN T, 1994, J VAC SCI TECHNOL B, V12, P3888
[8]  
GUO JZY, 1993, THESIS U WISCONSIN M
[9]  
HINSBERG WD, 1992, P SOC PHOTO-OPT INS, V1672, P24, DOI 10.1117/12.59723
[10]  
KRASNOPEROVA AA, 1994, P SOC PHOTO-OPT INS, V2194, P198, DOI 10.1117/12.175805