SELECTIVE HETEROEPITAXIAL GROWTH OF SI1-XGEX USING GAS SOURCE MOLECULAR-BEAM EPITAXY

被引:42
作者
HIRAYAMA, H
HIROI, M
KOYAMA, K
TATSUMI, T
机构
[1] Microelectronics Research Laboratories, NEC Corporation, Miyamae-Ku, Kawasaki 213
关键词
D O I
10.1063/1.102582
中图分类号
O59 [应用物理学];
学科分类号
摘要
Si1-xGex heteroepitaxial layers have been grown on Si(100) surfaces by gas source molecular beam epitaxy. Si2H 6 and GeH4 were used as the Si and Ge source gases, respectively. The Ge mole fraction x in the grown film was found to be controlled by the GeH4 flow rate. The growth rate decreased gradually with increasing GeH4 flow rate. Selective epitaxial growth of Si1-xGex using a SiO2 mark on a Si(100) substrate was successfully achieved.
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页码:1107 / 1109
页数:3
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