PRODUCTION AND ANNEALING OF COLOR CENTERS IN RF SPUTTERED SIO2 FILMS

被引:36
作者
HICKMOTT, TW
机构
关键词
D O I
10.1063/1.1660577
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2543 / &
相关论文
共 41 条
[1]   SPUTTERING OF DIELECTRICS BY HIGH-FREQUENCY FIELDS [J].
ANDERSON, GS ;
MAYER, WN ;
WEHNER, GK .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (10) :2991-&
[2]  
BILLINGTON DS, 1961, RADIAT DAMAGE SOLIDS, P249
[3]   STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS SILICON FILMS [J].
BRODSKY, MH ;
TITLE, RS ;
WEISER, K ;
PETTIT, GD .
PHYSICAL REVIEW B, 1970, 1 (06) :2632-&
[4]   ELECTRON PARAMAGNETIC RESONANCE STUDY ON SILICON GERMANIUM AND GALLIUM ARSENIDE SURFACES INTERACTING WITH ADSORBED OXYGEN [J].
CHAN, P ;
STEINEMA.A .
SURFACE SCIENCE, 1966, 5 (03) :267-&
[5]   NEUTRON SPECIFIC COLOR CENTER IN FUSED SILICA AND AN IMPURITY BAND OF IDENTICAL WAVELENGTH [J].
COHEN, AJ .
PHYSICAL REVIEW, 1957, 105 (04) :1151-1155
[6]   THEORY AND PRACTICE OF RF SPUTTERING [J].
DAVIDSE, PD .
VACUUM, 1967, 17 (03) :139-&
[7]  
DAVIDSE PD, 1966, J APPL PHYS, V37, P74
[8]  
HEAVENS OS, 1965, OPTICAL PROPERTIES T, P114
[9]   RADIATION DAMAGE IN RADIO-FREQUENCY-SPUTTERED SIO2 FILMS [J].
HICKMOTT, TW .
APPLIED PHYSICS LETTERS, 1969, 15 (07) :232-&
[10]   DETERMINATION OF ARGON CONTENT OF SPUTTERED SIO2 FILMS BY X-RAY FLUORESCENCE [J].
HOFFMEISTER, W ;
ZUEGEL, M .
THIN SOLID FILMS, 1969, 3 (01) :35-+