LOW EMITTER RESISTANCE GAAS BASED HBTS WITHOUT INGAAS CAPS

被引:20
作者
SLATER, DB [1 ]
ENQUIST, PM [1 ]
HUTCHBY, JA [1 ]
MORRIS, AS [1 ]
TREW, RJ [1 ]
机构
[1] N CAROLINA STATE UNIV,RALEIGH,NC 27695
关键词
D O I
10.1109/55.291602
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Low emitter resistance is demonstrated for AlGaAs/GaAs heterojunction bipolar transistors using Pd/Ge contacts on a GaAs contact layer. The contact resistivity to 2-10 x 10(18) cm-3 n-type GaAs is 4-1 x 10(-7) OMEGA-cm2. These are comparable to contact resistivities obtained with non-alloyed contacts on InGaAs layers. The non-spiking Pd/Ge contact demonstrates thermal stability and area independent resistivity suitable for scaled devices. The substitution of Pd/Ge for AuGe/Ni GaAs emitter and collector contacts reduced by an order of magnitude the emitter-base offset voltage at high current densities and increased f(t) by more than 15% with significantly improved uniformity for devices with 2 and 2.6 mum wide emitters having lengths two, four and six times the width.
引用
收藏
页码:154 / 156
页数:3
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