STACKING-FAULT ANNIHILATION DEPENDENCE ON SURFACE ORIENTATION IN SILICON

被引：9

作者：

HAYAFUJI, Y

KAWADO, S

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 02期

关键词：

D O I：

10.1063/1.330528

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1215 / 1217

页数：3

共 17 条

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