CONDUCTION-BAND DISCONTINUITY IN INGAP/GAAS MEASURED USING BOTH CURRENT-VOLTAGE AND PHOTOEMISSION METHODS

被引:47
作者
LEE, TW
HOUSTON, PA
KUMAR, R
YANG, XF
HILL, G
HOPKINSON, M
CLAXTON, PA
机构
[1] Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, Mappin Street
关键词
D O I
10.1063/1.106639
中图分类号
O59 [应用物理学];
学科分类号
摘要
Both current-voltage and photoemission measurements of the conduction-band discontinuity of the same InGaP/GaAs p-n heterojunction have been carried out. Interpretation of the current-voltage results using thermionic emission theory applied to a heterojunction bipolar transistor have resulted in a conduction-band offset value of 0.21 eV in the case of a compositionally abrupt junction. This figure has been confirmed by performing independent photoemission measurements on the same junction.
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页码:474 / 476
页数:3
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