RAMAN-SCATTERING OF INGAAS/INP GROWN BY UNIFORM RADIAL FLOW EPITAXY

被引:36
作者
FENG, ZC [1 ]
ALLERMAN, AA [1 ]
BARNES, PA [1 ]
PERKOWITZ, S [1 ]
机构
[1] AUBURN UNIV,DEPT PHYS,AUBURN,AL 36849
关键词
D O I
10.1063/1.107187
中图分类号
O59 [应用物理学];
学科分类号
摘要
Uniform radial flow epitaxy, a novel growth technique, has been used to grow InGaAs films on InP. Epitaxial layers above and below the critical thickness for the onset of slip were grown. We used Raman spectroscopy to characterize the quality of epitaxial layers, determine alloy composition, and measure the strain. Raman spectra from both pseudomorphic (strained) and relaxed (unstrained) InGaAs films were obtained at 300 and 80 K. The difference in the frequencies of their GaAs-like longitudinal optical phonons was used to calculate stress for the strained InGaAs/InP, leading to a direct formula for the evaluation of the layer stress.
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页码:1848 / 1850
页数:3
相关论文
共 22 条
[11]  
KAKIMOTO K, 1982, APPL PHYS LETT, V40, P826, DOI 10.1063/1.93281
[12]   CHARACTERIZATION OF DISORDERED BONDS IN SI-IMPLANTED GA0.47IN0.53AS WITH LASER RAMAN-SPECTROSCOPY [J].
KAKIMOTO, K ;
KATODA, T .
APPLIED PHYSICS LETTERS, 1983, 42 (09) :811-812
[13]   STUDY OF COOLING OF HOT CARRIERS AND INTERVALLEY SCATTERING IN IN0.53GA0.47AS BY SUBPICOSECOND RAMAN-SCATTERING [J].
KIM, DS ;
YU, PY .
APPLIED PHYSICS LETTERS, 1990, 56 (16) :1570-1572
[14]   EFFECTS OF STRAIN AND LAYER THICKNESS ON THE GROWTH OF INXGA1-XAS-GAAS STRAINED-LAYER SUPERLATTICES [J].
LAIDIG, WD ;
PENG, CK ;
LIN, YF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (02) :181-185
[15]  
PALIK ED, 1985, HDB OPTICAL CONSTANT, P438
[16]   SINGLE LONGITUDINAL-MODE OPTICAL PHONON-SCATTERING IN GA0.47IN0.53AS [J].
PEARSALL, TP ;
CARLES, R ;
PORTAL, JC .
APPLIED PHYSICS LETTERS, 1983, 42 (05) :436-438
[17]  
PEARSALL TP, 1982, GAINASP ALLOY SEMICO, P61
[18]   COMPARATIVE THERMODYNAMIC ANALYSIS OF INP AND GAAS DEPOSITION [J].
SHAW, DW .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1975, 36 (02) :111-118
[19]   VAPOR-PHASE EPITAXIAL-GROWTH AND CHARACTERIZATION OF GA1-YINYAS1-XPX QUATERNARY ALLOYS [J].
SUGIYAMA, K ;
KOJIMA, H ;
ENDA, H ;
SHIBATA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (12) :2197-2203
[20]   CRITICAL LAYER THICKNESS IN STRAINED GA1-XINXAS/INP QUANTUM WELLS [J].
TEMKIN, H ;
GERSHONI, DG ;
CHU, SNG ;
VANDENBERG, JM ;
HAMM, RA ;
PANISH, MB .
APPLIED PHYSICS LETTERS, 1989, 55 (16) :1668-1670