ON MECHANISM OF HFE DEGRADATION BY EMITTER-BASE REVERSE CURRENT STRESS

被引：20

作者：

VERWEY, JF

机构：

来源：

MICROELECTRONICS RELIABILITY | 1970年 / 9卷 / 05期

关键词：

D O I：

10.1016/0026-2714(70)90434-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：425 / &

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