ORIGIN OF RESIDUAL PERSISTENT PHOTOCONDUCTIVITY IN SELECTIVELY DOPED GAAS/ALXGA1-XAS HETEROJUNCTIONS

被引:24
作者
THEIS, TN
WRIGHT, SL
机构
关键词
D O I
10.1063/1.97028
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1374 / 1376
页数:3
相关论文
共 20 条
[1]   ELIMINATION OF PERSISTENT PHOTOCONDUCTIVITY AND IMPROVEMENT IN SI ACTIVATION COEFFICIENT BY AL SPATIAL SEPARATION FROM GA AND SI IN AL-GA-AS-SI SOLID SYSTEM - A NOVEL SHORT-PERIOD ALAS/N-GAAS SUPER-LATTICE [J].
BABA, T ;
MIZUTANI, T ;
OGAWA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (10) :L627-L629
[2]   BIAS DEPENDENCE AND LIGHT SENSITIVITY OF (AL,GA)AS/GAAS MODFETS AT 77-K [J].
DRUMMOND, TJ ;
FISCHER, RJ ;
KOPP, WF ;
MORKOC, H ;
LEE, K ;
SHUR, MS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (12) :1806-1811
[3]  
KANE MJ, 1985, UNPUB 13 P YAM C EL
[4]   STUDY OF PERSISTENT PHOTOCONDUCTIVITY EFFECT IN N-TYPE SELECTIVELY DOPED ALGAAS/GAAS HETEROJUNCTION [J].
KASTALSKY, A ;
HWANG, JCM .
SOLID STATE COMMUNICATIONS, 1984, 51 (05) :317-322
[5]   ILLUMINATION STIMULATED PERSISTENT CHANNEL DEPLETION AT SELECTIVELY DOPED AL0.3GA0.7AS/GAAS INTERFACE [J].
KASTALSKY, A ;
HWANG, JCM .
APPLIED PHYSICS LETTERS, 1984, 44 (03) :333-335
[6]   PERSISTENT CHANNEL DEPLETION CAUSED BY HOT-ELECTRON TRAPPING EFFECT IN SELECTIVELY DOPED N-ALGAAS/GAAS STRUCTURES [J].
KINOSHITA, H ;
NISHI, S ;
AKIYAMA, M ;
ISHIDA, T ;
KAMINISHI, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (03) :377-378
[7]   TRAPPING CHARACTERISTICS AND A DONOR-COMPLEX (DX) MODEL FOR THE PERSISTENT PHOTOCONDUCTIVITY TRAPPING CENTER IN TE-DOPED ALXGA1-XAS [J].
LANG, DV ;
LOGAN, RA ;
JAROS, M .
PHYSICAL REVIEW B, 1979, 19 (02) :1015-1030
[8]  
LEE H, 1984, I PHYS C SER, V74, P321
[9]   CRYOGENIC OPERATION OF PSEUDOMORPHIC ALGAAS/INGAAS SINGLE-QUANTUM-WELL MODFETS [J].
MASSELINK, WT ;
KETTERSON, A ;
KLEM, J ;
KOPP, W ;
MORKOC, H .
ELECTRONICS LETTERS, 1985, 21 (20) :937-939
[10]  
MOONEY PM, COMMUNICATION