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MECHANISMS OF CHEMICAL VAPOR-DEPOSITION OF SILICON
被引:67
作者
:
NISHIZAWA, J
论文数:
0
引用数:
0
h-index:
0
NISHIZAWA, J
NIHIRA, H
论文数:
0
引用数:
0
h-index:
0
NIHIRA, H
机构
:
来源
:
JOURNAL OF CRYSTAL GROWTH
|
1978年
/ 45卷
/ 01期
关键词
:
D O I
:
10.1016/0022-0248(78)90418-9
中图分类号
:
O7 [晶体学];
学科分类号
:
0702 ;
070205 ;
0703 ;
080501 ;
摘要
:
引用
收藏
页码:82 / 89
页数:8
相关论文
共 15 条
[11]
PERFECT CRYSTAL-GROWTH OF SILICON BY VAPOR-DEPOSITION
NISHIZAWA, JI
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,RES INST ELECT COMMUN,SENDAI,JAPAN
NISHIZAWA, JI
TERASAKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,RES INST ELECT COMMUN,SENDAI,JAPAN
TERASAKI, T
YAGI, K
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,RES INST ELECT COMMUN,SENDAI,JAPAN
YAGI, K
MIYAMOTO, N
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,RES INST ELECT COMMUN,SENDAI,JAPAN
MIYAMOTO, N
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(05)
: 664
-
669
[12]
INELASTIC LIGHT-SCATTERING STUDIES OF SILICON CHEMICAL VAPOR-DEPOSITION (CVD) SYSTEMS
SEDGWICK, TO
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
SEDGWICK, TO
SMITH, JE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
SMITH, JE
GHEZ, R
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
GHEZ, R
COWHER, ME
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
COWHER, ME
[J].
JOURNAL OF CRYSTAL GROWTH,
1975,
31
(DEC)
: 264
-
273
[13]
DEFECT-FREE NUCLEATION OF SILICON ON [111] SILICON SURFACES
SHIMBO, M
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV, RES INST ELECT COMMUN, SENDAI, JAPAN
SHIMBO, M
NISHIZAWA, J
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV, RES INST ELECT COMMUN, SENDAI, JAPAN
NISHIZAWA, J
TERASAKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV, RES INST ELECT COMMUN, SENDAI, JAPAN
TERASAKI, T
[J].
JOURNAL OF CRYSTAL GROWTH,
1974,
23
(04)
: 267
-
274
[14]
SIRTL E, 1974, J ELECTROCHEM SOC, V121, P919, DOI 10.1149/1.2401953
[15]
1965, JANAF THERMOCHEMICAL, V1
←
1
2
→
共 15 条
[11]
PERFECT CRYSTAL-GROWTH OF SILICON BY VAPOR-DEPOSITION
NISHIZAWA, JI
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,RES INST ELECT COMMUN,SENDAI,JAPAN
NISHIZAWA, JI
TERASAKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,RES INST ELECT COMMUN,SENDAI,JAPAN
TERASAKI, T
YAGI, K
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,RES INST ELECT COMMUN,SENDAI,JAPAN
YAGI, K
MIYAMOTO, N
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,RES INST ELECT COMMUN,SENDAI,JAPAN
MIYAMOTO, N
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(05)
: 664
-
669
[12]
INELASTIC LIGHT-SCATTERING STUDIES OF SILICON CHEMICAL VAPOR-DEPOSITION (CVD) SYSTEMS
SEDGWICK, TO
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
SEDGWICK, TO
SMITH, JE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
SMITH, JE
GHEZ, R
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
GHEZ, R
COWHER, ME
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,TJ WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
COWHER, ME
[J].
JOURNAL OF CRYSTAL GROWTH,
1975,
31
(DEC)
: 264
-
273
[13]
DEFECT-FREE NUCLEATION OF SILICON ON [111] SILICON SURFACES
SHIMBO, M
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV, RES INST ELECT COMMUN, SENDAI, JAPAN
SHIMBO, M
NISHIZAWA, J
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV, RES INST ELECT COMMUN, SENDAI, JAPAN
NISHIZAWA, J
TERASAKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV, RES INST ELECT COMMUN, SENDAI, JAPAN
TERASAKI, T
[J].
JOURNAL OF CRYSTAL GROWTH,
1974,
23
(04)
: 267
-
274
[14]
SIRTL E, 1974, J ELECTROCHEM SOC, V121, P919, DOI 10.1149/1.2401953
[15]
1965, JANAF THERMOCHEMICAL, V1
←
1
2
→