DOPANT SEGREGATION IN CZ AND MCZ SILICON CRYSTAL-GROWTH - A COMPARISON BETWEEN EXPERIMENT AND NUMERICAL-SIMULATION

被引:12
作者
KIM, KM [1 ]
LANGLOIS, WE [1 ]
机构
[1] IBM CORP,DIV RES,ALMADEN RES CTR,SAN JOSE,CA 95120
关键词
D O I
10.1149/1.2096807
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1137 / 1142
页数:6
相关论文
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