EVIDENCE FOR QUANTUM CONFINEMENT IN POROUS SILICON FROM SOFT-X-RAY ABSORPTION

被引:62
作者
VANBUUREN, T
GAO, Y
TIEDJE, T
DAHN, JR
WAY, BM
机构
[1] UNIV BRITISH COLUMBIA,DEPT ELECT ENGN,VANCOUVER V6T 1W5,BC,CANADA
[2] SIMON FRASER UNIV,DEPT PHYS,BURNABY V5A 1S6,BC,CANADA
关键词
D O I
10.1063/1.106793
中图分类号
O59 [应用物理学];
学科分类号
摘要
Measurements of x-ray absorption in the vicinity of the silicon L edge in porous silicon show a blueshift and a broadening of the conduction band edge, consistent with a distribution of quantum confinement energies. The absorption spectrum for porous silicon can be fit by a broadened and energy-shifted version of the crystalline silicon absorption spectrum. The average quantum shift and broadening used in the fit to the absorption spectrum are in reasonable agreement with the corresponding parameters derived from the photoluminescence spectrum.
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收藏
页码:3013 / 3015
页数:3
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