DESCRIPTION OF ELECTRONIC TRANSPORT-PROPERTIES OF MONO-CRYSTALLINE FILMS BY A STATISTICAL-MODEL

被引:44
作者
TELLIER, CR
TOSSER, AJ
机构
关键词
D O I
10.1016/0040-6090(80)90362-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:225 / 234
页数:10
相关论文
共 43 条
[1]   EFFECT OF GRAIN-BOUNDARY SCATTERING ON THE ELECTRON-TRANSPORT OF ALUMINUM FILMS [J].
BANDYOPADHYAY, SK ;
PAL, AK .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1979, 12 (06) :953-&
[2]  
BARUA DC, 1975, INDIAN J PHYS, V49, P603
[3]   SIZE EFFECTS IN RESISTIVITY OF EPITAXIAL-FILMS OF SILVER [J].
BERMAN, A ;
JURETSCHKE, HJ .
PHYSICAL REVIEW B, 1975, 11 (08) :2893-2902
[4]   VALIDITY OF APPROXIMATE EQUATIONS FOR CALCULATION OF ELECTRON MEAN FREE PATH IN TERMS OF SIZE EFFECT THEORY [J].
BORRAJO, J ;
HERAS, JM .
THIN SOLID FILMS, 1973, 18 (02) :267-273
[5]   ROLE OF STRUCTURAL DEFECTS IN ELECTRON-TRANSPORT PROPERTIES OF COPPER-FILMS [J].
CHOPRA, KL ;
SURI, R ;
THAKOOR, AP .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (02) :538-546
[6]  
CHOPRA KL, 1969, THIN FILM PHENOMENA, P365
[7]   RESISTIVITY AND MICROSTRUCTURE OF POLYCRYSTALLINE AU FILMS DEPOSITED BY RF BIAS-DIODE AND TRIODE SPUTTERING [J].
CORNELY, RH ;
ALI, TA .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (07) :4094-4097
[8]  
COTTEY AA, 1968, THIN SOLID FILMS, V4, P297
[9]   SIZE EFFECTS IN EPITAXIAL ALUMINUM FILMS [J].
DOBIERZEWSKAMOZRZYMAS, E ;
WARKUSZ, F .
THIN SOLID FILMS, 1977, 43 (03) :267-273
[10]   ELECTRICAL-PROPERTIES OF EPITAXIAL ALUMINUM FILMS [J].
DOBIERZEWSKAMOZRZYMAS, E ;
WARKUSZ, F .
ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1979, 5 (04) :223-226