COMBINED AUGER-ELECTRON SPECTROSCOPY AND SCANNING ELECTRON-MICROSCOPY

被引：13

作者：

ASHWELL, GWB ^{[1
]}

TODD, CJ ^{[1
]}

HECKINGBOTTOM, R ^{[1
]}

机构：

[1] PO, RES STN, LONDON NW2 7DT, ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 05期

关键词：

D O I：

10.1088/0022-3735/6/5/011

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：435 / 438

页数：4

相关论文

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