INVESTIGATION OF SILICON-OXYGEN INTERACTIONS USING AUGER ELECTRON SPECTROSCOPY

被引：100

作者：

JOYCE, BA

NEAVE, JH

机构：

来源：

SURFACE SCIENCE | 1971年 / 27卷 / 03期

关键词：

D O I：

10.1016/0039-6028(71)90184-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：499 / &

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