INGAAS/INP QUANTUM-WELL WIRES FABRICATED BY GSMBE, MOCVD, AND SELECTIVE CHEMICAL ETCHING TECHNIQUES

被引:11
作者
NAGANUMA, M
NOTOMI, M
IWAMURA, H
OKAMOTO, M
NISHIDA, T
TAMAMURA, T
机构
[1] NTT Opto-electronics Laboratories, Kanagawa Pref., 243-01, 3-1, Morinsato Wakamiya, Astugi-shi
关键词
D O I
10.1016/0022-0248(90)90372-R
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
InGaAs/InP quantum well wires with dimensions down to 10 nm are fabricated by GSMBE, MOCVD and selective and anisotropic chemical etching technique combined with electron beam lithography. A clear cathodoluminescence blue shift was observed for the wires whose cross-sectional dimensions were 5 nm in thickness and about 30 nm in width. With the method developed here, it is possible to fabricate ultrafine structures even less than 10 nm in size. © 1990.
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页码:254 / 259
页数:6
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