APPLICATION OF THE SHUBNIKOV-DEHAAS OSCILLATIONS IN THE CHARACTERIZATION OF SI MOSFETS AND GAAS MODFETS

被引：10

作者：

CHOU, SY

ANTONIADIS, DA

SMITH, HI

机构：

[1] MIT,DEPT PHYS,CAMBRIDGE,MA 02139

[2] MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139

[3] MIT,MICROSYST TECHNOL LABS,CAMBRIDGE,MA 02139

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1987年 / 34卷 / 04期

关键词：

D O I：

10.1109/T-ED.1987.23011

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：883 / 889

页数：7

共 16 条

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