DEGRADATION OF CARRIER LIFETIME IN SILICON-CRYSTALS AT ROOM-TEMPERATURE

被引:14
作者
GRAFF, K
PIEPER, H
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1978年 / 49卷 / 01期
关键词
D O I
10.1002/pssa.2210490116
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:137 / 144
页数:8
相关论文
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