STUDY OF INTER-DIFFUSION BETWEEN THIN-FILMS OF SILVER AND PALLADIUM USING AUGER SPECTROMETRY

被引：11

作者：

GUGLIELMACCI, JM

GILLET, M

机构：

来源：

SURFACE SCIENCE | 1981年 / 105卷 / 01期

关键词：

D O I：

10.1016/0039-6028(81)90170-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：386 / 394

页数：9

共 12 条

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GILLET, M .

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[7] FORMALISM FOR EXTRACTING DIFFUSION-COEFFICIENTS FROM CONCENTRATION PROFILES [J].

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[8] DEPTH RESOLUTION AND SURFACE-ROUGHNESS EFFECTS IN SPUTTER PROFILING OF NICR MULTILAYER SANDWICH SAMPLES USING AUGER-ELECTRON SPECTROSCOPY [J].

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[9] USE OF AUGER-ELECTRON SPECTROSCOPY AND INERT-GAS SPUTTERING FOR OBTAINING CHEMICAL PROFILES [J].

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[10]

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