INFLUENCE OF AN IMPURITY PROFILE ON DETERMINATION OF INTERFACE STATES

被引：4

作者：

FELTL, H

机构：

来源：

SOLID-STATE ELECTRONICS | 1978年 / 21卷 / 10期

关键词：

D O I：

10.1016/0038-1101(78)90370-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1227 / 1230

页数：4

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