ELECTRICAL-CONDUCTION AT ELEVATED-TEMPERATURES IN THERMALLY GROWN SILICON DIOXIDE FILMS

被引:25
作者
MILLS, TG
KROGER, FA
机构
[1] TRW SYST GRP, SEMICOND DIV, LAWNDALE, CA 90260 USA
[2] UNIV SO CALIF, DEPT MAT SCI, LOS ANGELES, CA 90007 USA
关键词
D O I
10.1149/1.2403308
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1582 / 1586
页数:5
相关论文
共 12 条
[1]   ELECTRONIC CONDUCTION IN THERMALLY GROWN SILICON DIOXIDE FILMS [J].
BRANDER, RW ;
LAMB, DR ;
RUNDLE, PC .
BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (01) :23-&
[2]   CHARACTERISTICS OF SURFACE-STATE CHARGE (QSS) OF THERMALLY OXIDIZED SILICON [J].
DEAL, BE ;
SKLAR, M ;
GROVE, AS ;
SNOW, EH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (03) :266-+
[3]  
HISKES OR, 1969, MATER SCI ENG, V4, P169
[4]   EFFECT OF AN ELECTRIC FIELD ON SILICON OXIDATION [J].
JORGENSEN .
JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) :874-&
[5]  
KROGER FA, 1964, P BRIT CERAMIC SOC, V1, P187
[6]   THE MECHANISMS FOR SILICON OXIDATION IN STEAM AND OXYGEN [J].
LIGENZA, JR ;
SPITZER, WG .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1960, 14 :131-136
[7]   PERMEATION OF GASEOUS OXYGEN THROUGH VITREOUS SILICA [J].
NORTON, FJ .
NATURE, 1961, 191 (478) :701-&
[8]  
Swalin R., 1962, THERMODYNAMICS SOLID
[10]   SODIUM DISTRIBUTION IN THERMAL OXIDE ON SILICON BY RADIOCHEMICAL AND MOS ANALYSIS [J].
YON, E ;
KO, WH ;
KUPER, AB .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) :276-+