DIRECT AUGER RECOMBINATION IN DEGENERATE DIRECT GAP SEMICONDUCTORS

被引:8
作者
TANGUY, C
COMBESCOT, M
机构
[1] Ecole Normale Superieure, Groupe de, Physique des Solides, Paris, Fr, Ecole Normale Superieure, Groupe de Physique des Solides, Paris, Fr
关键词
D O I
10.1016/0038-1098(86)90626-5
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We show that the density dependence of the Auger lifetime differs from the usual Cn** minus **2 law when a direct process (without phonons) takes place in a degenerate electron-hole plasma with one parabolic conduction band and one parabolic valence band. The lifetime roughly increases by a factor 20 when the plasma Fermi energy E//F approx. n**2**/**3 goes from the band gap E//G to the threshold E//0 (approx. E//G/6) of this direct process, while, close to threshold, it behaves like (E//F minus E//0)** minus **4.
引用
收藏
页码:539 / 541
页数:3
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