ADDITIONAL BIBLIOGRAPHY OF METAL-INSULATOR-SEMICONDUCTOR STUDIES

被引:16
作者
SCHLEGEL, ES
机构
[1] Microelectronics Division, Philco-Ford Corporation, Blue Bell
关键词
D O I
10.1109/T-ED.1968.16544
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A supplementary bibliography containing 158 papers in the field of metal-insulator-semiconductor theory and technology updates the bibliography previously published in this Transactions. The classifications are as follows: MOS transistor behavior, physics, preparation of oxide layers, techniques for evaluating insulator layers, device fabrication technology, radiation effects, alternative materials to Si02• Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.
引用
收藏
页码:951 / +
页数:1
相关论文
共 159 条
[2]   SURFACE STATES AND 1/F NOISE IN MOS TRANSISTORS [J].
ABOWITZ, G ;
ARNOLD, E ;
LEVENTHA.EA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (11) :775-+
[3]  
ADAM H, 1967, 3 T INT VAC C S I ED, V2, P17
[4]   SOME PROPERTIES OF VAPOR DEPOSITED SILICON NITRIDE FILMS USING SIH4-NH3-H2 SYSTEM [J].
BEAN, KE ;
GLEIM, PS ;
YEAKLEY, RL ;
RUNYAN, WR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (07) :733-&
[5]  
BIRK R, 1968, T METALL SOC AIME, V242, P523
[6]   THERMAL OXIDATION OF SILICON USING WET OXYGEN [J].
BISHOP, BA ;
HOGARTH, CA .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1967, 22 (05) :455-&
[7]  
BOWER RW, CHARACTERIZATION MOS
[8]  
BROWN D, 1967 FALL M EL SOC C
[9]   PROPERTIES OF SIXOYNZ FILMS ON SI [J].
BROWN, DM ;
GRAY, PV ;
HEUMANN, FK ;
PHILIPP, HR ;
TAFT, EA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (03) :311-&
[10]   STUDIES OF SODIUM IN SIO2 FILMS BY NEUTRON ACTIVATION AND RADIOTRACER TECHNIQUES [J].
BUCK, TM ;
ALLEN, FG ;
DALTON, JV ;
STRUTHERS, JD .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (08) :862-+