DETERMINATION OF THE ELECTRON SATURATION VELOCITY IN PSEUDOMORPHIC ALXGA1-XAS/INYGA1-YAS MODFETS AT 300-K AND 100-K

被引:19
作者
DICKMANN, J [1 ]
HEEDT, CH [1 ]
DAEMBKES, H [1 ]
机构
[1] UNIV DUISBURG GESAMTHSCH,ELECT ENGN,D-4100 DUISBURG,FED REP GER
关键词
D O I
10.1109/16.40916
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:2315 / 2319
页数:5
相关论文
共 15 条
[1]   ANALYSIS OF CHARGE CONTROL IN PSEUDOMORPHIC TWO-DIMENSIONAL ELECTRON-GAS FIELD-EFFECT TRANSISTORS [J].
ANDO, Y ;
ITOH, T .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (12) :2295-2301
[2]  
Camnitz L. H., 1985, Proceedings of the IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits (Cat. No.85CH2173-3), P199
[3]   DETERMINATION OF CARRIER SATURATION VELOCITY IN SHORT-GATE-LENGTH MODULATION-DOPED FETS [J].
DAS, MB ;
KOPP, W ;
MORKOC, H .
IEEE ELECTRON DEVICE LETTERS, 1984, 5 (11) :446-449
[4]   DESIGN CALCULATIONS FOR SUB-MICRON GATE-LENGTH ALGAAS/GAAS MODULATION-DOPED FET STRUCTURES USING CARRIER SATURATION VELOCITY CHARGE-CONTROL MODEL [J].
DAS, MB ;
ROSZAK, ML .
SOLID-STATE ELECTRONICS, 1985, 28 (10) :997-1005
[5]   METAL-(N) ALGAAS-GAAS TWO-DIMENSIONAL ELECTRON-GAS FET [J].
DELAGEBEAUDEUF, D ;
LINH, NT .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (06) :955-960
[6]   ELECTRON SATURATION VELOCITY VARIATION IN INGAAS AND GAAS CHANNEL MODFETS FOR GATE LENGTHS TO 550-A [J].
DELAHOUSSAYE, PR ;
ALLEE, DR ;
PAO, YC ;
SCHLOM, DG ;
HARRIS, JS ;
PEASE, RFW .
IEEE ELECTRON DEVICE LETTERS, 1988, 9 (03) :148-150
[7]  
GEYER A, Patent No. 3839770
[8]  
GEYER A, IN PRESS J VAC SCI B
[9]   DETERMINATION OF CARRIER SATURATION VELOCITY IN HIGH-PERFORMANCE INYGA1-YAS/ALXGA1-XAS MODULATION-DOPED FIELD-EFFECT TRANSISTORS (0 LESS-THAN-OR-EQUAL-TO-Y LESS-THAN-OR-EQUAL-TO-0.2) [J].
HENDERSON, TS ;
MASSELINK, WT ;
KOPP, W ;
MORKOC, H .
IEEE ELECTRON DEVICE LETTERS, 1986, 7 (05) :288-290
[10]   CHARACTERIZATION OF INGAAS/ALGAAS PSEUDOMORPHIC MODULATION-DOPED FIELD-EFFECT TRANSISTORS [J].
KETTERSON, AA ;
MASSELINK, WT ;
GEDYMIN, JS ;
KLEM, J ;
PENG, CK ;
KOPP, WF ;
MORKOC, H ;
GLEASON, KR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (05) :564-571