FLASH LAMP ANNEALING OF ION-IMPLANTED SILICON

被引:9
作者
HEINIG, KH
HOHMUTH, K
KLABES, R
VOELSKOW, M
WOITTENNEK, H
机构
来源
RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1982年 / 63卷 / 1-4期
关键词
D O I
10.1080/00337578208222831
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
引用
收藏
页码:115 / 123
页数:9
相关论文
共 18 条
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    [J]. APPLIED PHYSICS LETTERS, 1978, 32 (05) : 276 - 278
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  • [8] A DESCRIPTION OF THE LASER-INDUCED ANNEALING AND DIFFUSION BEHAVIOR OF IMPLANTED SILICON-CRYSTALS
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    [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1980, 47 (1-4): : 157 - 161
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