SPATIAL-DISTRIBUTION OF DOMINANT ELECTRON AND HOLE TRAPS IN PLASTICALLY DEFORMED GAAS

被引:12
作者
WOSINSKI, T [1 ]
BREITENSTEIN, O [1 ]
机构
[1] AKAD WISSENSCH DDR,INST FESTKORPERPHYS & ELEKTRMIKROSKOPIE,DDR-4020 HALLE,GER DEM REP
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1986年 / 96卷 / 01期
关键词
D O I
10.1002/pssa.2210960138
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:311 / 315
页数:5
相关论文
共 12 条
[1]   SCANNING DEEP LEVEL TRANSIENT SPECTROSCOPY (SDLTS) [J].
BREITENSTEIN, O ;
HEYDENREICH, J .
SCANNING, 1985, 7 (06) :273-289
[2]   SCANNING-DLTS INVESTIGATION OF THE EL-2 LEVEL IN PLASTICALLY DEFORMED GAAS [J].
BREITENSTEIN, O ;
WOSINSKI, T .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 77 (02) :K107-&
[3]   MECHANISM FOR THE CREATION OF ANTISITE DEFECTS, DURING COMBINED CLIMB-GLIDE MOTION OF DISLOCATIONS IN SPHALERITE-STRUCTURE CRYSTALS [J].
FIGIELSKI, T .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 36 (04) :217-219
[4]   DOUBLE ANION ANTISITE IN GAAS - THE SIMPLEST MEMBER OF EL2 FAMILY [J].
FIGIELSKI, T ;
KACZMAREK, E ;
WOSINSKI, T .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 38 (04) :253-261
[5]   STUDY OF DEFORMATION-PRODUCED DEEP LEVELS IN N-GAAS USING DEEP LEVEL TRANSIENT CAPACITANCE SPECTROSCOPY [J].
ISHIDA, T ;
MAEDA, K ;
TAKEUCHI, S .
APPLIED PHYSICS, 1980, 21 (03) :257-261
[6]   NATIVE HOLE TRAP IN BULK GAAS AND ITS ASSOCIATION WITH THE DOUBLE-CHARGE STATE OF THE ARSENIC ANTISITE DEFECT [J].
LAGOWSKI, J ;
LIN, DG ;
CHEN, TP ;
SKOWRONSKI, M ;
GATOS, HC .
APPLIED PHYSICS LETTERS, 1985, 47 (09) :929-931
[7]  
Lang D.V., 1979, TOP APPL PHYS, P93, DOI 10.1007/3540095950_9
[8]   HOLE TRAPS IN BULK AND EPITAXIAL GAAS CRYSTALS [J].
MITONNEAU, A ;
MARTIN, GM ;
MIRCEA, A .
ELECTRONICS LETTERS, 1977, 13 (22) :666-668
[9]   NEW SPECTROSCOPIC TECHNIQUE FOR IMAGING SPATIAL-DISTRIBUTION OF NONRADIATIVE DEFECTS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].
PETROFF, PM ;
LANG, DV .
APPLIED PHYSICS LETTERS, 1977, 31 (02) :60-62
[10]   VARIATION OF THE MIDGAP ELECTRON TRAPS (EL2) IN LIQUID ENCAPSULATED CZOCHRALSKI GAAS [J].
TANIGUCHI, M ;
IKOMA, T .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) :6448-6451