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RAMAN-SPECTROSCOPY - VERSATILE TOOL FOR CHARACTERIZATION OF THIN-FILMS AND HETEROSTRUCTURES OF GAAS AND ALXGA1-XAS
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APPLIED PHYSICS,
1978, 16 (04)
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OBSERVATIONS OF PHONON LINE BROADENING IN III-V SEMICONDUCTORS BY SURFACE REFLECTION RAMAN-SCATTERING
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PHYSICAL REVIEW B,
1974, 9 (04)
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[8]
OPTICAL ABSORPTION OF GALLIUM ARSENIDE BETWEEN 0.6 AND 2.75 EV
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PHYSICAL REVIEW,
1962, 127 (03)
:768-+