RETENTION-TEMPERATURE AND ENDURANCE CHARACTERISTICS OF THE MNOS CAPACITOR WITH PROCESSING VARIATIONS AS PARAMETER

被引：5

作者：

DEALMEIDA, AM

LI, SS

机构：

[1] Univ of Florida, Gainesville, FL,, USA, Univ of Florida, Gainesville, FL, USA

来源：

SOLID-STATE ELECTRONICS | 1987年 / 30卷 / 09期

关键词：

MNOS CAPACITORS;

D O I：

10.1016/0038-1101(87)90123-7

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：889 / 894

页数：6

共 17 条

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