DUAL-DISCHARGE IONIZATION SOURCE

[1] SAMPLING A HOLLOW-CATHODE DISCHARGE WITH A QUADRUPOLE MASS FILTER [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1978, 28 (04): : 409 - 425

[2] SIMPLIFIED SOLIDS MASS-SPECTROMETER COMBINING A GLOW-DISCHARGE SOURCE WITH A QUADRUPOLE MASS FILTER [J]. ANALYTICAL CHEMISTRY, 1978, 50 (02) : 373 - 375

[3] BRUHN CG, 1978, ANAL CHEM, V50, P16, DOI 10.1021/ac50023a010

[4] COBINE JD, 1941, GASEOUS CONDUCTORS T

[5] PLASMA DIAGNOSTICS OF AN RF-SPUTTERING GLOW DISCHARGE [J]. APPLIED PHYSICS LETTERS, 1971, 18 (10) : 435 - &

[6] GLOW-DISCHARGE MASS-SPECTROMETRY - TECHNIQUE FOR DETERMINING ELEMENTAL COMPOSITION PROFILES IN SOLIDS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (04) : 1779 - 1786

[7] NEW TECHNIQUE FOR ELEMENTAL ANALYSIS OF THIN SURFACE LAYERS OF SOLIDS [J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 350 - &

[8] MASS-SPECTROMETRIC STUDY OF NEUTRAL-SPUTTERED SPECIES IN AN RF GLOW-DISCHARGE SPUTTERING SYSTEM [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 151 - 154

[9] HOLLOW-CATHODE IONIZATION FOR MASS-SPECTROMETRIC ANALYSIS OF CONDUCTING SOLIDS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (09) : 1236 - 1242

[10] CRITICAL PARAMETERS AFFECTING HOLLOW-CATHODE ION-SOURCE [J]. ANALYTICAL CHEMISTRY, 1975, 47 (07) : 1024 - 1028

[1] SAMPLING A HOLLOW-CATHODE DISCHARGE WITH A QUADRUPOLE MASS FILTER [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1978, 28 (04): : 409 - 425

[2] SIMPLIFIED SOLIDS MASS-SPECTROMETER COMBINING A GLOW-DISCHARGE SOURCE WITH A QUADRUPOLE MASS FILTER [J]. ANALYTICAL CHEMISTRY, 1978, 50 (02) : 373 - 375

[3] BRUHN CG, 1978, ANAL CHEM, V50, P16, DOI 10.1021/ac50023a010

[4] COBINE JD, 1941, GASEOUS CONDUCTORS T

[5] PLASMA DIAGNOSTICS OF AN RF-SPUTTERING GLOW DISCHARGE [J]. APPLIED PHYSICS LETTERS, 1971, 18 (10) : 435 - &

[6] GLOW-DISCHARGE MASS-SPECTROMETRY - TECHNIQUE FOR DETERMINING ELEMENTAL COMPOSITION PROFILES IN SOLIDS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (04) : 1779 - 1786

[7] NEW TECHNIQUE FOR ELEMENTAL ANALYSIS OF THIN SURFACE LAYERS OF SOLIDS [J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 350 - &

[8] MASS-SPECTROMETRIC STUDY OF NEUTRAL-SPUTTERED SPECIES IN AN RF GLOW-DISCHARGE SPUTTERING SYSTEM [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 151 - 154

[9] HOLLOW-CATHODE IONIZATION FOR MASS-SPECTROMETRIC ANALYSIS OF CONDUCTING SOLIDS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (09) : 1236 - 1242

[10] CRITICAL PARAMETERS AFFECTING HOLLOW-CATHODE ION-SOURCE [J]. ANALYTICAL CHEMISTRY, 1975, 47 (07) : 1024 - 1028