CURRENT-VOLTAGE CHARACTERISTICS OF POROUS-SILICON LAYERS

被引:73
作者
DIMITROV, DB
机构
[1] Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia-1784
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 03期
关键词
D O I
10.1103/PhysRevB.51.1562
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The current-voltage characteristics of porous-silicon structures are presented and discussed. Evidence is given that the forward and reverse currents show Schottky-junction-like behavior. Experimental measurements of reverse I-V curves at different ambient humidities demonstrate that the reverse current depends strongly on this parameter. The results are discussed in the light of generation-recombination processes in the porous-silicon depletion region. The presence of an inflection point in the reverse I-V curves is explained by the energy-band-gap difference between porous silicon and the crystalline silicon substrate. © 1995 The American Physical Society.
引用
收藏
页码:1562 / 1566
页数:5
相关论文
共 29 条
  • [1] INVESTIGATIONS OF THE ELECTRICAL-PROPERTIES OF POROUS SILICON
    ANDERSON, RC
    MULLER, RS
    TOBIAS, CW
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1991, 138 (11) : 3406 - 3411
  • [2] BESHKOV G, 1993, ELECTRON ELECTROTECH, V10, P43
  • [3] THE ORIGIN OF VISIBLE LUMINESCENCE FROM POROUS SILICON - A NEW INTERPRETATION
    BRANDT, MS
    FUCHS, HD
    STUTZMANN, M
    WEBER, J
    CARDONA, M
    [J]. SOLID STATE COMMUNICATIONS, 1992, 81 (04) : 307 - 312
  • [4] SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS
    CANHAM, LT
    [J]. APPLIED PHYSICS LETTERS, 1990, 57 (10) : 1046 - 1048
  • [5] STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES
    CARD, HC
    RHODERICK, EH
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (10) : 1589 - +
  • [6] POTENTIAL BARRIERS TO ELECTRON TUNNELLING IN ULTRATHIN FILMS OF SIO2
    CARD, HC
    [J]. SOLID STATE COMMUNICATIONS, 1974, 14 (10) : 1011 - 1014
  • [7] DIMITROV DB, IN PRESS J PHYS
  • [8] VISIBLE LUMINESCENCE FROM SILICON-WAFERS SUBJECTED TO STAIN ETCHES
    FATHAUER, RW
    GEORGE, T
    KSENDZOV, A
    VASQUEZ, RP
    [J]. APPLIED PHYSICS LETTERS, 1992, 60 (08) : 995 - 997
  • [9] EVIDENCE FOR QUANTUM CONFINEMENT IN THE PHOTOLUMINESCENCE OF POROUS SI AND SIGE
    GARDELIS, S
    RIMMER, JS
    DAWSON, P
    HAMILTON, B
    KUBIAK, RA
    WHALL, TE
    PARKER, EHC
    [J]. APPLIED PHYSICS LETTERS, 1991, 59 (17) : 2118 - 2120
  • [10] SURFACE EFFECTS ON P-N JUNCTIONS - CHARACTERISTICS OF SURFACE SPACE-CHARGE REGIONS UNDER NON-EQUILIBRIUM CONDITIONS
    GROVE, AS
    FITZGERALD, DJ
    [J]. SOLID-STATE ELECTRONICS, 1966, 9 (08) : 783 - +