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CONTROL OF RF SPUTTERED FILM PROPERTIES THROUGH SUBSTRATE TUNING
被引:78
作者
:
LOGAN, JS
论文数:
0
引用数:
0
h-index:
0
LOGAN, JS
机构
:
来源
:
IBM JOURNAL OF RESEARCH AND DEVELOPMENT
|
1970年
/ 14卷
/ 02期
关键词
:
D O I
:
10.1147/rd.142.0172
中图分类号
:
TP3 [计算技术、计算机技术];
学科分类号
:
0812 ;
摘要
:
引用
收藏
页码:172 / &
相关论文
共 8 条
[1]
BUTLER HS, 1961, 820 STANF U REP
[2]
APPLICATION OF RF DISCHARGES TO SPUTTERING
KOENIG, HR
论文数:
0
引用数:
0
h-index:
0
KOENIG, HR
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
: 168
-
&
[3]
RE-EMISSION OF SPUTTERED SIO2 DURING GROWTH AND ITS RELATION TO FILM QUALITY
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
JONES, RE
论文数:
0
引用数:
0
h-index:
0
JONES, RE
STANDLEY, CL
论文数:
0
引用数:
0
h-index:
0
STANDLEY, CL
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
: 176
-
&
[4]
THIN FILMS DEPOSITED BY BIAS SPUTTERING
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
SCHAIBLE, PM
论文数:
0
引用数:
0
h-index:
0
SCHAIBLE, PM
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(01)
: 237
-
&
[5]
PROPERTIES OF INSULATING THIN FILMS DEPOSITED BY RF SPUTTERING
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
DAVIDSE, PD
论文数:
0
引用数:
0
h-index:
0
DAVIDSE, PD
LEHMAN, HS
论文数:
0
引用数:
0
h-index:
0
LEHMAN, HS
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1967,
11
(04)
: 461
-
&
[6]
EVIDENCE FOR OXIDATION GROWTH AT THE OXIDE-SILICON INTERFACE FROM CONTROLLED ETCH STUDIES
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
GNALL, RP
论文数:
0
引用数:
0
h-index:
0
GNALL, RP
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1964,
111
(07)
: 872
-
873
[7]
ARGON CONTENT OF SIO2 FILMS DEPOSITED BY RF SPUTTERING IN ARGON
SCHWARTZ, GC
论文数:
0
引用数:
0
h-index:
0
SCHWARTZ, GC
JONES, RE
论文数:
0
引用数:
0
h-index:
0
JONES, RE
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(01)
: 52
-
&
[8]
GAS INCORPORATION INTO SPUTTERED FILMS
WINTERS, HF
论文数:
0
引用数:
0
h-index:
0
WINTERS, HF
KAY, E
论文数:
0
引用数:
0
h-index:
0
KAY, E
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(10)
: 3928
-
&
←
1
→
共 8 条
[1]
BUTLER HS, 1961, 820 STANF U REP
[2]
APPLICATION OF RF DISCHARGES TO SPUTTERING
KOENIG, HR
论文数:
0
引用数:
0
h-index:
0
KOENIG, HR
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
: 168
-
&
[3]
RE-EMISSION OF SPUTTERED SIO2 DURING GROWTH AND ITS RELATION TO FILM QUALITY
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
JONES, RE
论文数:
0
引用数:
0
h-index:
0
JONES, RE
STANDLEY, CL
论文数:
0
引用数:
0
h-index:
0
STANDLEY, CL
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
: 176
-
&
[4]
THIN FILMS DEPOSITED BY BIAS SPUTTERING
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
SCHAIBLE, PM
论文数:
0
引用数:
0
h-index:
0
SCHAIBLE, PM
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(01)
: 237
-
&
[5]
PROPERTIES OF INSULATING THIN FILMS DEPOSITED BY RF SPUTTERING
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
DAVIDSE, PD
论文数:
0
引用数:
0
h-index:
0
DAVIDSE, PD
LEHMAN, HS
论文数:
0
引用数:
0
h-index:
0
LEHMAN, HS
MAISSEL, LI
论文数:
0
引用数:
0
h-index:
0
MAISSEL, LI
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1967,
11
(04)
: 461
-
&
[6]
EVIDENCE FOR OXIDATION GROWTH AT THE OXIDE-SILICON INTERFACE FROM CONTROLLED ETCH STUDIES
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
GNALL, RP
论文数:
0
引用数:
0
h-index:
0
GNALL, RP
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1964,
111
(07)
: 872
-
873
[7]
ARGON CONTENT OF SIO2 FILMS DEPOSITED BY RF SPUTTERING IN ARGON
SCHWARTZ, GC
论文数:
0
引用数:
0
h-index:
0
SCHWARTZ, GC
JONES, RE
论文数:
0
引用数:
0
h-index:
0
JONES, RE
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(01)
: 52
-
&
[8]
GAS INCORPORATION INTO SPUTTERED FILMS
WINTERS, HF
论文数:
0
引用数:
0
h-index:
0
WINTERS, HF
KAY, E
论文数:
0
引用数:
0
h-index:
0
KAY, E
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(10)
: 3928
-
&
←
1
→