CALORIMETRIC EVIDENCE FOR STRUCTURAL RELAXATION IN AMORPHOUS-SILICON

被引:179
作者
ROORDA, S [1 ]
DOORN, S [1 ]
SINKE, WC [1 ]
SCHOLTE, PMLO [1 ]
VANLOENEN, E [1 ]
机构
[1] PHILIPS RES LABS,5600 JA EINDHOVEN,NETHERLANDS
关键词
D O I
10.1103/PhysRevLett.62.1880
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1880 / 1883
页数:4
相关论文
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