HIGH-QUALITY SILICON-ON-INSULATOR SUBSTRATES BY IMPLANTED OXYGEN IONS

被引:7
作者
BELZ, J
BURBACH, G
VOGT, H
PETERWEIDEMANN, J
ZIMMER, G
机构
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1989年 / 4卷 / 1-4期
关键词
D O I
10.1016/0921-5107(89)90282-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:429 / 433
页数:5
相关论文
共 17 条
  • [1] BELZ J, 1989, GME4 VDE FACHB, P103
  • [2] BELZ J, 1989, IN PRESS VACUUM TECH
  • [3] BENSAHEL D, 1987, SPIE, V797, P33
  • [4] CHEN CED, 1988, MATER RES SOC S P, V107, P309
  • [5] HIGH-PERFORMANCE SOI-CMOS TRANSISTORS IN OXYGEN-IMPLANTED SILICON WITHOUT EPITAXY
    DAVIS, JR
    REESON, KJ
    HEMMENT, PLF
    MARSH, CD
    [J]. IEEE ELECTRON DEVICE LETTERS, 1987, 8 (07) : 291 - 293
  • [6] MONITORING OF SIMOX LAYER PROPERTIES AND IMPLANTATION TEMPERATURE BY OPTICAL MEASUREMENTS
    HARBEKE, G
    STEIGMEIER, EF
    HEMMENT, P
    REESON, KJ
    JASTRZEBSKI, L
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1987, 2 (10) : 687 - 690
  • [7] CMOS DEVICES FABRICATED ON BURIED SIO2 LAYERS FORMED BY OXYGEN IMPLANTATION INTO SILICON
    IZUMI, K
    DOKEN, M
    ARIYOSHI, H
    [J]. ELECTRONICS LETTERS, 1978, 14 (18) : 593 - 594
  • [8] LOW-TEMPERATURE GROWTH OF SILICON DIOXIDE FILMS - A STUDY OF CHEMICAL BONDING BY ELLIPSOMETRY AND INFRARED-SPECTROSCOPY
    LUCOVSKY, G
    MANITINI, MJ
    SRIVASTAVA, JK
    IRENE, EA
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (02): : 530 - 537
  • [9] MAO BY, 1987, IEEE ELECTR DEVICE L, V8, P306
  • [10] THE CHARACTERISTICS OF CMOS DEVICES IN OXYGEN-IMPLANTED SILICON-ON-INSULATOR STRUCTURES
    MAO, BY
    SUNDARESAN, R
    CHEN, CED
    MATLOUBIAN, M
    POLLACK, G
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (05) : 629 - 633