共 16 条
[11]
SI-SIO2 INTERFACE - ELECTRICAL PROPERTIES AS DETERMINED BY METAL-INSULATOR-SILICON CONDUCTANCE TECHNIQUE
[J].
BELL SYSTEM TECHNICAL JOURNAL,
1967, 46 (06)
:1055-+
[13]
PROPERTIES OF SEMICONDUCTOR SURFACE INVERSION LAYERS IN ELECTRIC QUANTUM LIMIT
[J].
PHYSICAL REVIEW,
1967, 163 (03)
:816-&
[15]
WEBER E, 1965, ELECTROMAGNETIC THEO, pCH8
[16]
PERCOLATION ON A CONTINUUM AND LOCALIZATION-DELOCALIZATION TRANSITION IN AMORPHOUS SEMICONDUCTORS
[J].
PHYSICAL REVIEW B-SOLID STATE,
1971, 4 (12)
:4471-+