STATUS OF SOFT-X-RAY PHOTOEMISSION MICROSCOPY UTILIZING SYNCHROTRON-RADIATION

被引:2
作者
RAYCHAUDHURI, AK
CERRINA, F
机构
[1] UNIV WISCONSIN,CTR XRAY LITHOG,STOUGHTON,WI 53589
[2] UNIV WISCONSIN,DEPT ELECT & COMP ENGN,STOUGHTON,WI 53589
基金
美国国家科学基金会;
关键词
D O I
10.1016/0168-583X(94)95244-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We briefly review recent progress in the field of soft X-ray photoemission spectromicroscopy. Different approaches have produced instruments which are highly complementary to each other. We observe that the field has matured from demonstration experiments to work which utilizes the unique capabilities of each microscope, providing new insights in various fields such as materials science, surface physics, and biology. Advances in X-ray sources, optics, detectors, and alignment techniques will be synergistic in the continuing development of this field. In particular, the advent of next generation synchrotrons with unprecedented brightness will enable routine operation at the theoretical limits of several microscope designs as well as allow other photoemission techniques to become viable.
引用
收藏
页码:104 / 111
页数:8
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